LOYOLA COLLEGE (AUTONOMOUS), CHENNAI – 600 034
B.Sc. DEGREE EXAMINATION –STATISTICS
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SIXTH SEMESTER – APRIL 2007
ST 6602 – STATISTICAL PROCESS CONTROL
Date & Time: 20/04/2007 / 9:00 – 12:00 Dept. No. Max. : 100 Marks
PART-A
Answer all the questions: 10×2=20
- Mention any 4 advantages of a control chart.
- Write the 3-σ control limits for a c-chart with the process average equal to 4 defects.
- The control limits for a p-chart are given below
UCL=.161,CL=.08,LCL=0,n=100
Find the equivalent control limits for an np chart.
- Write the need for an EWMA control chart.
- Define consumers risk,producers risk.
- Mention any 4 advantages of acceptance sampling.
- Write the expression for AOQ of a double sampling plan.
- Write the control limits for an s-chart when σ is given.
- Explain the term process capability.
- What are the uses of a stem and leaf plot?
PART-B
Answer any 5 questions: 5×8=40
- The number of defective switches in samples of size 150 are shown below. Construct a fraction defective chart for these data.
Sample number number of defective
switches
1 8
2 1
3 3
4 0
5 2
6 4
7 0
8 1
9 10
10 6
11 6
12 0
- Explain the oc curve of a control chart in detail.
- Explain the theory behind the construction of control limits for and S charts.
- Explain the double sampling plan in detail.
- Draw box-whisker plots for the following data on two variables and compare.
Sample no: 1 2 3 4 5 6 7 8 9 10 11 12
x1 : 6 10 7 8 9 12 16 7 9 15 8 6
x2 : 15 11 5 13 13 10 9 4 12 13 16 11
- Explain the CUSUM chart in detail.
- Explain the methods of measuring process capability in detail.
- A p-chart is used with UCl=.19,CL=.1,LCL=.01 to control a process
- If 3-σ limits are used , find n .
- Obtain the α-risk.
- Obtain the β-risk if p has shifted to p=.2
PART-C
Answer any 2 questions: 2 x 20=40
19.a) A paper mill uses a control chart to monitor the defects in finished rolls of a
paper. Use these data to set up chart for defects per roll of paper. Does the
process appear to be in control?
Day Number of Rolls Total number of defects
1 18 12
2 18 14
3 24 20
4 22 18
5 22 15
6 22 12
7 20 11
8 20 15
9 20 12
10 20 10
- b) Explain the need for
i)Pareto diagram
ii)Cause and effect diagram
iii)Defect concentration diagram in statistical process control .
- a)The data shown below represents from nominal diameter value for holes drilled
in aerospace manufacturing.
Sample no x1 x2 x3 x4 x5
1 -30 50 -20 10 30
2 0 50 -60 -20 30
3 -50 10 20 30 20
4 -10 -10 30 -20 50
5 20 -40 50 20 10
6 0 0 40 -40 20
7 0 0 20 -20 10
8 70 -30 30 -10 0
9 0 0 20 -20 10
10 10 20 30 10 50
Set up & R charts. Is the process in control?
b)A normally distributed quality characteristic is controlled through use of an
and R charts.
char R-chart
UCL=626 UCL=18.795
CL=620 CL=8.236
LCL=614 LCL=0
- i) If specifications are 610±15 what percentage of defective items is produced?
- ii) What is the probability of detecting a shift in the process mean to be 610 on
the first sample? (σ remains constant).
iii) What is the probability of type I error?
- iv) If S chart were to be used for the R chart what would be the approximate
parameters of the S chart? (4x 2.5)
- a) Draw EWMA control chart for the following data on the sample mean with λ = .2 ,σ = 2.
Sample number x
- 45
- 55
- 37
- 64
- 95
- 08
- 5
- 87
- 25
- 46
- 39
- 69
b)Also obtain the tabular CUSUM values with Δ=.5σ ,α=.005
- a) Draw the oc curve for a single sampling plan with n=100,c=2,N=1000
- b) Obtain the single sampling plan for which
P= .01, α = .05, P= .06, β= .10
- c) Obtain the expressions for AOQ and ATI. (10+10)
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